A novel approach to studying the viscosity of water has revealed new insights about the behavior of water molecules and may open pathways for liquid-based electronics. Researchers have used a high-resolution inelastic X-ray scattering technique to measure the strong bond involving a hydrogen atom sandwiched between two oxygen atoms. This hydrogen bond is a quantum-mechanical phenomenon responsible for various properties of water, including viscosity, which determines a liquid’s resistance to flow or to change shape.
